YORDANI, M. F.; SUDARYANTO, A. Pengujian Sistem Monitoring Listrik Berbasis NodeMCU Menggunakan Blackbox Testing. Informatics, Electrical and Electronics Engineering (Infotron), [S. l.], v. 1, n. 2, p. 50–55, 2021. DOI: 10.33474/infotron.v1i2.11331. Disponível em: https://riset.unisma.ac.id/index.php/INFOTRON/article/view/11331. Acesso em: 18 oct. 2026.